Semiconductor test device and manufacturing method thereof

ABSTRACT

A semiconductor test device for measuring a contact resistance includes: first fin structures, upper portions of the first fin structures protruding from an isolation insulating layer; epitaxial layers formed on the upper portions of the first fin structures, respectively; first conductive layers formed on the epitaxial layers, respectively; a first contact layer disposed on the first conductive layers at a first point; a second contact layer disposed on the first conductive layers at a second point apart from the first point; a first pad coupled to the first contact layer via a first wiring; and a second pad coupled to the second contact layer via a second wiring. The semiconductor test device is configured to measure the contact resistance between the first contact layer and the first fin structures by applying a current between the first pad and the second pad.

TECHNICAL FIELD

The disclosure relates to semiconductor test devices for measuring acontact resistance, methods of manufacturing the semiconductor testdevices and contact resistance measurement methods using thesemiconductor test devices.

BACKGROUND

As the semiconductor industry has progressed into nanometer technologyprocess nodes in pursuit of higher device density, lowering a contactresistance between a source/drain epitaxial layer and a conductivecontact layer including a silicide layer has become one of the importantissues. Thus, semiconductor test devices (structures) which can moreprecisely measure contact resistance have been required.

BRIEF DESCRIPTION OF THE DRAWINGS

The present disclosure is best understood from the following detaileddescription when read with the accompanying figures. It is emphasizedthat, in accordance with the standard practice in the industry, variousfeatures are not drawn to scale and are used for illustration purposesonly. In fact, the dimensions of the various features may be arbitrarilyincreased or reduced for clarity of discussion.

FIGS. 1A-1D show various views of a semiconductor test device accordingto an embodiment of the present disclosure. FIG. 1A is a perspectiveview and FIG. 1B is a cross sectional view of a semiconductor testdevice according to an embodiment of the present disclosure. FIGS. 1Cand 1D show cross sectional views of semiconductor test devicesaccording to other embodiments of the present disclosure.

FIG. 2A is a plan view (layout) and FIG. 2B is a perspective view of asemiconductor test device according to an embodiment of the presentdisclosure. FIG. 2C is an equivalent circuit diagram of thesemiconductor test device.

FIG. 3A shows a perspective view and FIG. 3B shows a cross sectionalview of one of the various stages of manufacturing a semiconductor testdevice according to an embodiment of the present disclosure.

FIG. 4A shows a perspective view and FIG. 4B shows a cross sectionalview of one of the various stages of manufacturing a semiconductor testdevice according to an embodiment of the present disclosure.

FIG. 5A shows a perspective view and FIG. 5B shows a cross sectionalview of one of the various stages of manufacturing a semiconductor testdevice according to an embodiment of the present disclosure.

FIG. 6A shows a perspective view and FIG. 6B shows a cross sectionalview of one of the various stages of manufacturing a semiconductor testdevice according to an embodiment of the present disclosure.

FIG. 7A shows a perspective view and FIG. 7B shows a cross sectionalview of one of the various stages of manufacturing a semiconductor testdevice according to an embodiment of the present disclosure.

FIG. 8A shows a perspective view and FIG. 8B shows a cross sectionalview of one of the various stages of manufacturing a semiconductor testdevice according to an embodiment of the present disclosure.

FIG. 9A shows a perspective view and FIG. 9B shows a cross sectionalview of one of the various stages of manufacturing a semiconductor testdevice according to an embodiment of the present disclosure.

FIG. 10A shows a perspective view and FIG. 10B shows a cross sectionalview of one of the various stages of manufacturing a semiconductor testdevice according to an embodiment of the present disclosure.

FIG. 11A shows a perspective view and FIG. 11B shows a cross sectionalview of one of the various stages of manufacturing a semiconductor testdevice according to an embodiment of the present disclosure.

FIG. 12A shows a perspective view, FIG. 12B shows a cross sectional viewand FIG. 12C is a cut view of one of the various stages of manufacturinga semiconductor test device according to an embodiment of the presentdisclosure.

FIG. 13A shows a perspective view, FIG. 13B shows a cross sectional viewand FIG. 13C is a cut view of one of the various stages of manufacturinga semiconductor test device according to an embodiment of the presentdisclosure.

FIG. 14A shows a perspective view, FIG. 14B shows a cross sectional viewand FIG. 14C is a cut view of one of the various stages of manufacturinga semiconductor test device according to an embodiment of the presentdisclosure.

FIG. 15A shows a perspective view, FIG. 15B shows a cross sectional viewand FIG. 15C is a cut view of one of the various stages of manufacturinga semiconductor test device according to an embodiment of the presentdisclosure.

FIG. 16A shows a perspective view, FIG. 16B shows a cross sectional viewand FIG. 16C is a cut view of one of the various stages of manufacturinga semiconductor test device according to an embodiment of the presentdisclosure.

FIG. 17A shows a perspective view, FIG. 17B shows a cross sectional viewand FIG. 17C is a cut view of one of the various stages of manufacturinga semiconductor test device according to an embodiment of the presentdisclosure.

FIG. 18A shows a perspective view, FIG. 18B shows a cross sectional viewand FIG. 18C is a cut view of one of the various stages of manufacturinga semiconductor test device according to an embodiment of the presentdisclosure.

FIG. 19A shows a perspective view, FIG. 19B shows a cross sectional viewand FIG. 19C is a cut view of one of the various stages of manufacturinga semiconductor test device according to an embodiment of the presentdisclosure.

FIG. 20A shows a perspective view, FIG. 20B shows a cross sectional viewand FIG. 20C is a cut view of one of the various stages of manufacturinga semiconductor test device according to an embodiment of the presentdisclosure.

FIG. 21A shows a perspective view, FIG. 21B shows a cross sectional viewand FIG. 21C is a cut view of one of the various stages of manufacturinga semiconductor test device according to an embodiment of the presentdisclosure.

DETAILED DESCRIPTION

It is to be understood that the following disclosure provides manydifferent embodiments, or examples, for implementing different featuresof the invention. Specific embodiments or examples of components andarrangements are described below to simplify the present disclosure.These are, of course, merely examples and are not intended to belimiting. For example, dimensions of elements are not limited to thedisclosed range or values, but may depend upon process conditions and/ordesired properties of the device. Moreover, the formation of a firstfeature over or on a second feature in the description that follows mayinclude embodiments in which the first and second features are formed indirect contact, and may also include embodiments in which additionalfeatures may be formed interposing the first and second features, suchthat the first and second features may not be in direct contact. Variousfeatures may be arbitrarily drawn in different scales for simplicity andclarity.

Further, spatially relative terms, such as “beneath,” “below,” “lower,”“above,” “upper” and the like, may be used herein for ease ofdescription to describe one element or feature's relationship to anotherelement(s) or feature(s) as illustrated in the figures. The spatiallyrelative terms are intended to encompass different orientations of thedevice in use or operation in addition to the orientation depicted inthe figures. The apparatus may be otherwise oriented (rotated 90 degreesor at other orientations) and the spatially relative descriptors usedherein may likewise be interpreted accordingly. In addition, the term“being made of” may mean either “comprising” or “consisting of.” Theterm “at least one of A and B” means “A”, “B” or “A and B” and does notmean “one from A and one from B” unless otherwise explained.

In the present disclosure, a semiconductor test device for measuring acontact resistance between a source/drain epitaxial layer of a fieldeffect transistor (FET) and a conductive contact layer including asilicide layer is explained. The semiconductor test structure isfabricated with FETs on the same substrate (wafer) during thefabrication of the FETs. In this disclosure, a source/drain refers to asource and/or a drain. Further, the FET of the present disclosureincludes a planar FET, a fin FET (FinFET) and/or a gate-all-around FET(GAA FET).

The contact layer to the source/drain epitaxial layer is one of the keystructures of the advanced FETs. If the contact area between the contactlayer and the source/drain epitaxial layer is small, a contactresistance between the contact layer and the source/drain epitaxiallayer increases. In particular, when the sides the source/drainepitaxial layer are not fully in contact with the contact layer,sufficiently low contact resistance cannot be obtained.

FIGS. 1A-1D show various views of a semiconductor test device accordingto an embodiment of the present disclosure. FIG. 1A is a perspectiveview and FIG. 1B is a cross sectional view of a semiconductor testdevice according to an embodiment of the present disclosure. FIGS. 1Cand 1D show cross sectional views of semiconductor test devicesaccording to other embodiments of the present disclosure.

In the present disclosure, as shown in FIGS. 1A-1D, the top and thesides of the source/drain epitaxial layer (e.g., 160) are fully covered(i.e., wrapped) by the contact layer (e.g., 170).

As shown in FIGS. 1A-1D, a plurality of semiconductor fin structures 120are provided over a semiconductor substrate 110. In some embodiments,the substrate 110 includes a single crystalline semiconductor layer onat least its surface portion. The substrate 110 may comprise a singlecrystalline semiconductor material such as, but not limited to Si, Ge,SiGe, GaAs, InSb, GaP, GaSb, InAlAs, InGaAs, GaSbP, GaAsSb and InP. Incertain embodiments, the substrate 110 is made of crystalline Si.

The substrate 110 may include in its surface region, one or more bufferlayers (not shown). The buffer layers can serve to gradually change thelattice constant from that of the substrate to that of the source/drainregions. The buffer layers may be formed from epitaxially grown singlecrystalline semiconductor materials such as, but not limited to Si, Ge,GeSn, SiGe, GaAs, InSb, GaP, GaSb, InAlAs, InGaAs, GaSbP, GaAsSb, GaN,GaP, and InP. In a particular embodiment, the substrate 110 comprisessilicon germanium (SiGe) buffer layers epitaxially grown on the siliconsubstrate 110. The germanium concentration of the SiGe buffer layers mayincrease from 30 atomic % germanium for the bottom-most buffer layer to70 atomic % germanium for the top-most buffer layer.

The bottom part of the fin structures 120 are covered by an insulatinglayer 116 (a fin liner layer). The fin liner layer 116 includes one ormore layers of insulating material.

An isolation insulating layer 130, such as shallow trench isolation(STI), is disposed in the trenches over the substrate 110. The isolationinsulating layer 130 may be made of suitable dielectric materials suchas silicon oxide, silicon nitride, silicon oxynitride, fluorine-dopedsilicate glass (FSG), low-k dielectrics such as carbon doped oxides,extremely low-k dielectrics such as porous carbon doped silicon dioxide,a polymer such as polyimide, combinations of these, or the like. In someembodiments, the isolation insulating layer 130 is formed through aprocess such as CVD, flowable CVD (FCVD), or a spin-on-glass process,although any acceptable process may be utilized.

As shown in FIGS. 1A-1D, upper portions 122 of the fin structures areexposed from the isolation insulating layer 130. In some embodiments,the upper portions 122 of the fin structures include stacked layers offirst semiconductor layers 123 and second semiconductor layer 124, asshown in FIG. 1B. In other embodiments, as shown in FIG. 1C, the upperportions 123 are continuous structures of the fin structures 120.Further, in other embodiments, there are substantially no upper portionsand epitaxial layers are formed over the bottom portions of the finstructures as shown in FIG. 1D.

As shown in FIGS. 1A-1C, a semiconductor epitaxial layer 160 is formedon respective upper portions 122 or 123. The semiconductor epitaxiallayer 160 has the same structure as a source/drain epitaxial layer ofFETs. In the case of FIG. 1D, a semiconductor epitaxial layer 161 isformed over the fin structures 120.

Further, an alloy layer 172 is formed on the epitaxial layer 160. Thealloy layer 172 includes at least one of Si and Ge, and one or more ofmetallic elements, such as W, Ni, Co, Ti, Cu and/or Al. In someembodiments, the alloy layer is a silicide layer, such as WSi, CoSi,NiSi, TiSi, MoSi and/or TaSi.

A contact layer 170 is disposed over the alloy layer 172. The contactlayer 170 includes one or more layers of conductive material, such asCo, Ni, W, Ti, Ta, Cu, Al, TiN and TaN. In some embodiments, the contactlayer 170 includes a glue (adhesive) layer 174 and a body layer 176. Incertain embodiments, the glue layer 174 is made of TiN and the bodylayer 176 includes one or more of Co, Ni, W, Ti, Ta, Cu and Al.

As shown in FIG. 1A, the contact layer 170 is formed in an opening 175which is formed in one or more dielectric layers. As explained below,the dielectric layers include a first dielectric layer 140, a seconddielectric layer 142, a third dielectric layer 144, a fourth dielectriclayer 150, a fifth dielectric layer 152 and a sixth dielectric layer 154in some embodiments. The dielectric layers are made of, for example,silicon oxide, silicon nitride, silicon oxynitride (SiON), SiOCN, SiCN,fluorine-doped silicate glass (FSG), or a low-K dielectric material.

As show in FIG. 1A, the number of the epitaxial layers (fin structures)within the opening is at least 5 in some embodiments, and at least 10 inother embodiments. The maximum number may be 30. The structures shown inFIGS. 1A-1D may hereinafter be called a resistance measurementstructure.

FIG. 2A is a plan view (layout) and FIG. 2B is a perspective view of asemiconductor test device according to an embodiment of the presentdisclosure. FIG. 2C is an equivalent circuit diagram of thesemiconductor test device.

As shown in FIG. 2A, first fin structures 121 extend in the Y directionand second fin structures 122 extend in the Y direction and are disposedadjacent to the first fin structures 121 in the X direction. Althoughfive first and second fin structures are illustrated, the numbers of thefirst and second fin structures are not limited to five.

A first resistance measurement structure 200-1 is disposed at a firstpoint of the first fin structures 121 and a second resistancemeasurement structure 200-2 is disposed at a second point of the firstfin structure 121. The first point and the second point are spaced apartfrom each other in the Y direction by a distance of about 100 nm toabout 2 μm in some embodiments. A third resistance measurement structure200-3 is disposed at a third point of the second fin structure 122. Thefirst point and the third point are located at substantially the same Yposition.

The contact layer 170-1 of the first resistance measurement structure200-1 is connected to a first pad 101 via one or more first wirings 111,the contact layer 170-2 of the second resistance measurement structure200-2 is connected to a second pad 102 via one or more second wirings112, and the contact layer 170-3 of the third resistance measurementstructure 200-3 is connected to a third pad 103 via one or more thirdwirings 113.

Next, a contact resistance measurement method will be explainedreferring to FIGS. 2A-2C. Voltage V is applied between the first pad 101and the second pad 102 so that a current I flows between the firstcontact resistance measurement structure 200-1 and the second contactresistance measurement structure 200-2 via the first fin structures 121.Then, voltage V1 at the first pad 101 and voltage V3 at the third pad103 is measured. Here, the third pad 103 is electrically coupled to thesubstrate 110 via the third wirings 113 and the third contact resistancemeasurement structure 200-3, no current flows in the third wiring 113.Thus, V3 is substantially equal to the voltage VB at the substrate or atthe bottom portions of the fin structures under the first resistancemeasurement structure 200-1. In FIG. 2C, R1 is a resistance of a via ora contact plug portion disposed on the contact layer 170-1, R2 is aresistance of the contact layer 170-1, R3 is a contact resistancebetween the contact layer 170-1 and the epitaxial layer 160 of thesource/drain region, R4 is a resistance of the well region (bottom ofthe semiconductor fin structures 120), R5 is resistance of the contactlayer 170-3, R6 is a resistance of the contact layer 170-3, and R7 is aresistance of a via or a contact plug portion disposed on the contactlayer 170-3.

By the following equation, the contact resistance R can be obtained:

$\frac{V_{3} - V_{1}}{I} = {R = {{R\; 1} + {R\; 2} + {R\; 3}}}$

FIGS. 3A-21C show exemplary sequential processes for manufacturing thesemiconductor test device according to one embodiment of the presentdisclosure. It is understood that additional operations can be providedbefore, during, and after processes shown by FIGS. 3A-21C, and some ofthe operations described below can be replaced or eliminated, foradditional embodiments of the method. The order of theoperations/processes may be interchangeable. In FIGS. 3A-21C, the “A”figures (e.g., FIGS. 3A, 4A, . . . ) are perspective views, the “B”figures (FIGS. 3B. 4B, . . . ) are cross sectional view along the Xdirection, and the “C” figures (e.g., FIGS. 12C, 13C, . . . ) are cutviews along the X direction.

It is noted that the semiconductor test structure is formed togetherwith functional circuit devices including FinFETs and/or GAA FETs.

As shown in FIGS. 3A and 3B, stacked semiconductor layers are formedover a substrate 10. The stacked semiconductor layers include firstsemiconductor layers 24 and second semiconductor layers 26. Further, abuffer layer 20 is formed between the substrate 10 and the stackedsemiconductor layers.

The first semiconductor layers 22 and the second semiconductor layers 24are made of materials having different lattice constants, and mayinclude one or more layers of Si, Ge, SiGe, GaAs, InSb, GaP, GaSb,InAlAs, InGaAs, GaSbP, GaAsSb or InP.

In some embodiments, the first semiconductor layers 22 and the secondsemiconductor layers 24 are made of Si, a Si compound, SiGe, Ge or a Gecompound. In one embodiment, the first semiconductor layers 22 areSi_(1-x)Ge_(x), where x is more than about 0.3, or Ge (x=1.0) and thesecond semiconductor layers 24 are Si or Si_(1-y)Ge_(y), where y is lessthan about 0.4, and x>y. In this disclosure, an “M” compound” or an “Mbased compound” means the majority of the compound is M. In anotherembodiment, the second semiconductor layers 24 are Si_(1-y)Ge_(y), wherey is more than about 0.3, or Ge, and the first semiconductor layers 22are Si or Si_(1-x)Ge_(x), where x is less than about 0.4, and x<y. Inyet other embodiments, the first semiconductor layer 22 is made ofSi_(1-x)Ge_(x), where x is in a range from about 0.3 to about 0.8, andthe second semiconductor layer 24 is made of Si_(1-y)Ge_(y), where y isin a range from about 0.1 to about 0.4. The buffer layer 20 is made ofSi_(1-z)Ge_(z), where z>x and/or y.

In FIGS. 3A and 3B, four layers of the first semiconductor layer 22 andfour layers of the second semiconductor layer 24 are disposed. However,the number of the layers are not limited to four, and may be as small as1 (each layer) and in some embodiments, 2-10 layers of each of the firstand second semiconductor layers are formed. By adjusting the numbers ofthe stacked layers, a driving current of the GAA FET device can beadjusted.

The first semiconductor layers 22 and the second semiconductor layers 24are epitaxially formed over the buffer layer 20. The thickness of thefirst semiconductor layers 22 may be equal to or greater than that ofthe second semiconductor layers 24, and is in a range from about 2 nm toabout 20 nm in some embodiments, and is in a range from about 3 nm toabout 10 nm in other embodiments. The thickness of the secondsemiconductor layers 24 is in a range from about 2 nm to about 20 nm insome embodiments, and is in a range from about 3 nm to about 10 nm inother embodiments. The thickness of each of the first semiconductorlayers 22 and/or the thickness of each of the second semiconductorlayers may be the same, or may vary. The thickness of the buffer layer20 is in a range from about 10 nm to about 50 nm in some embodiments, oris in a range from 20 nm to 40 nm in other embodiments.

In some embodiments, instead of forming a stacked structure, a singleepitaxial layer is formed over the substrate 10 or the buffer layer 20.In such a case, the single epitaxial layer is made of Si_(1-s)Ge_(s),where 0.1<s≤1.0, and has a thickness about 30 nm to 100 nm, in someembodiments.

Next, the stacked layers of the first and second semiconductor layers22, 24 are patterned into fin structures 25 extending in the Ydirection, as shown in FIGS. 4A and 4B. In FIGS. 4A and 4B, two finstructures 25 are arranged in the X direction. But the number of the finstructures is not limited to two, and may be five or more (e.g., 10). Insome embodiments, one or more dummy fin structures are formed on bothsides of the fin structures 25 to improve pattern fidelity in thepatterning operations.

The width of the fin structure along the X direction is in a range fromabout 4 nm to about 10 nm in some embodiments, and is in a range fromabout 4 nm to about 8 nm in other embodiments. The pitch of the finstructures 25 is in a range from about 10 nm to about 50 nm in someembodiments, and is in a range from about 12 nm to about 40 nm in otherembodiments.

The stacked fin structure 25 may be patterned by any suitable method.For example, the structures may be patterned using one or morephotolithography processes, including double-patterning ormulti-patterning processes. Generally, double-patterning ormulti-patterning processes combine photolithography and self-alignedprocesses, allowing patterns to be created that have, for example,pitches smaller than what is otherwise obtainable using a single, directphotolithography process. For example, in one embodiment, a sacrificiallayer is formed over a substrate and patterned using a photolithographyprocess. Spacers are formed alongside the patterned sacrificial layerusing a self-aligned process. The sacrificial layer is then removed, andthe remaining spacers may then be used to pattern the stacked finstructure 25.

After the fin structures 25 are formed, an insulating material layer 30including one or more layers of insulating material is formed over thesubstrate so that the fin structures are fully embedded in theinsulating layer. The insulating material for the insulating layer mayinclude silicon oxide, silicon nitride, silicon oxynitride (SiON),SiOCN, SiCN, fluorine-doped silicate glass (FSG), or a low-K dielectricmaterial, formed by LPCVD (low pressure chemical vapor deposition),plasma-CVD or flowable CVD (FCVD). An anneal operation may be performedafter the formation of the insulating layer. Then, a planarizationoperation, such as a chemical mechanical polishing (CMP) method and/oran etch-back method, is performed such that the upper surface of theuppermost second semiconductor layer 26 is exposed from the insulatingmaterial layer, as shown in FIGS. 4A and 4B. In some embodiments, a finliner layer (not shown) is formed over the fin structures before formingthe insulating material layer. The fin liner layer is made of SiN or asilicon nitride-based material (e.g., SiON, SiCN or SiOCN).

Then, as shown in FIGS. 5A and 5B, the insulating material layer isrecessed to form an isolation insulating layer 30 so that the upperportions of the fin structures 25 are exposed. With this operation, thefin structures 25 are electrically separated from each other by theisolation insulating layer 30, which is also called shallow trenchisolation (STI). The height of the exposed portions of the finstructures 25 is in a range from about 30 nm to about 100 nm in someembodiments.

In the embodiment shown in FIGS. 5A and 5B, the insulating materiallayer is recessed until the upper portion of the buffer layer 20 isslightly exposed. In other embodiments, the upper portion of the bufferlayer 20 is not exposed.

After the isolation insulating layer 30 is formed, a first insulatinglayer 32 is formed to fully cover the exposed fin structures 25, asshown in FIGS. 6A and 6B. The first insulating layer 32 includes siliconoxide, silicon nitride, silicon oxynitride (SiON), SiOCN and/or SiCN, orother suitable insulating material. In certain embodiments, the firstinsulating layer 32 is made of silicon oxide, with a thickness of about1 nm to 3 nm formed by ALD and/or CVD.

Then, a second insulating layer 34 is formed on the first insulatinglayer 32 and over the isolation insulating layer 30, as shown in FIGS.7A and 7B. The second insulating layer 34 includes silicon oxide,silicon nitride, silicon oxynitride (SiON), SiOCN and/or SiCN, or othersuitable insulating material. In certain embodiments, the secondinsulating layer 34 is made of silicon nitride, with a thickness ofabout 10 nm to 15 nm formed by ALD and/or CVD. In some embodiments, thesecond insulating layer 34 is conformally formed.

Further, a third insulating layer 36 is formed on the second insulatinglayer 34, as shown in FIGS. 8A and 8B. The third insulating layer 36includes silicon oxide, silicon nitride, silicon oxynitride (SiON),SiOCN and/or SiCN, or other suitable insulating material. In certainembodiments, the third insulating layer 36 is made of silicon oxideformed by FCVD. In some embodiments, after the third insulating layer 36is formed by FCVD, an annealing operation is performed.

Subsequently, a planarization operation, such as CMP, is performed toremove excess portion of the third insulating layer 36 and to expose thesecond insulating layer 34, as shown in FIGS. 9A and 9B. In someembodiments, after the CMP operation, an annealing operation isperformed.

Then, a fourth insulating layer 40 is formed on the second and thirdinsulating layers 34, 36, and a fifth insulating layer 42 is furtherformed on the fourth insulating layer 40, as shown in FIGS. 10A and 10B.The fourth and fifth insulating layers are made of different materialsand include silicon oxide, silicon nitride, silicon oxynitride (SiON),SiOCN and/or SiCN, or other suitable insulating material. In certainembodiments, the fourth insulating layer 40 is made of silicon oxide,with a thickness of about 1 nm to 3 nm formed by ALD and/or CVD, and thefifth insulating layer 42 is made of silicon nitride, with a thicknessof about 10 nm to 30 nm formed by ALD and/or CVD.

Further, as shown in FIGS. 11A and 11B, a sixth insulating layer 44 isformed on the fifth insulating layer 42. The sixth insulating layer 44includes silicon oxide, silicon nitride, silicon oxynitride (SiON),SiOCN and/or SiCN, or other suitable insulating material. In certainembodiments, the sixth insulating layer 44 is made of silicon oxide,with a thickness of about 40 nm to 60 nm formed by ALD and/or CVD.

Next, a patterning operation, including one or more lithographyoperations and dry etching operations, is performed on the stackedinsulating layers to form an opening 48 as shown in FIGS. 12A-12C. Bythe patterning operation, the upper portions of the fin structures 25and the upper surface of the isolation insulating layer 30 are exposedinside the opening 48.

Subsequently, an epitaxial layer 50 is formed around the exposed finstructures 25, as shown in FIGS. 13A-13C. The epitaxial layer 50 isformed by the same operation to form source/drain epitaxial layers forFinFETs and/or GAA FETs. The epitaxial layer 50 includes one or morelayers of SiP, SiAs, SiC and SiCP for testing n-channel FETs or one ormore layers of SiB, SiGa, SiGe and SiGeB for testing p-channel FETs. Insome embodiments, dopants are introduced into the epitaxial layer 50 ata concentration in a range from about 5×10²⁰ cm⁻³ to about 6×10²¹ cm⁻³.The epitaxial layer 50 fully wraps around the exposed fin structuresrespectively, and does not merge with the adjacent epitaxial layer.

Then, as shown in FIGS. 14A-14D, a silicide layer 52 is formed over theepitaxial layer 50. The silicide layer 52 includes one or more of WSi,CoSi, NiSi, TiSi, RuSi, MoSi and TaSi. A metal layer is first formedover the epitaxial layer 50 and then an annealing operation is performedto form the silicide layer 52. In some embodiments, the silicide layerhas a thickness in a range from about 2 nm to about 4 nm.

Next, a glue layer 54 is formed inside the opening 48 and over the sixthinsulating layer 44, as shown in FIGS. 15A-15C. The silicide layer 52 iscovered by the glue layer 54. In some embodiments, the glue layerincludes TiN formed by CVD, PVD and/or ALD or other suitable methods,and has a thickness in a range from about 1 nm to about 4 nm.

Then, a contact body metal layer 60 is formed over the glue layer 54, asshown in FIGS. 16A-16C, and a planarization operation, such as CMP, isperformed to remove excess metal material, as shown in FIGS. 17A-17C.The body metal layer 60 includes one or more of Co, Ni, W, Ti, Ta, Cuand Al, formed by CVD, PVD, ALD and/or electro plating or other suitablemethods.

Subsequently, a seventh insulating layer 62 is formed over the bodymetal layer 60 and the sixth insulating layer 42, and an eighthinsulating layer 64 is formed over the seventh insulating layer 62. Theseventh and eighth insulating layers are made of different materials andinclude silicon oxide, silicon nitride, silicon oxynitride (SiON), SiOCNand/or SiCN, or other suitable insulating material. In certainembodiments, the seventh insulating layer 62 is made of silicon nitride,with a thickness of about 2 nm to 10 nm formed by ALD and/or CVD, andthe eighth insulating layer 64 is made of silicon oxide formed by ALDand/or CVD.

Next, a patterning operation, including one or more lithographyoperations and dry etching operations, is performed on the seventh andeighth insulating layers to form a contact opening 66 as shown in FIGS.18A-18C. By the patterning operation, the upper surface of the bodymetal layer 60 is exposed inside the opening 66.

Then, a contact metal layer 70 is formed in the contact opening 66, byforming a metal material layer and performing a planarization operation,such as CMP, as shown in FIGS. 19A-19C. The contact metal layer 70includes one or more of Co, Ni, W, Ti, Ta, Cu and Al.

Further, a ninth insulating layer 72 is formed over the contact metallayer 70 and the eighth insulating layer 64, and a tenth insulatinglayer 74 is formed over the ninth insulating layer 72. The ninth andtenth insulating layers are made of different materials and includesilicon oxide, silicon nitride, silicon oxynitride (SiON), SiOCN and/orSiCN, or other suitable insulating material. In certain embodiments, theninth insulating layer 72 is made of silicon nitride, with a thicknessof about 2 nm to 10 nm formed by ALD and/or CVD, or other suitablemethods, and the tenth insulating layer 74 is made of silicon oxideformed by ALD and/or CVD, or other suitable methods.

Next, a patterning operation, including one or more lithographyoperations and dry etching operations, is performed on the tenth andninth insulating layers to form a wiring opening 76 as shown in FIGS.20A-20C. By the patterning operation, the upper surface of the contactmetal layer 70 is exposed inside the opening 76.

Then, a wiring metal layer 80 is formed in the wiring opening 76, byforming a metal material layer and performing a planarization operation,such as CMP, as shown in FIGS. 21A-21C. The wiring metal layer 80includes one or more of Co, Ni, W, Ti, Ta, Cu and Al, formed by CVD,PVD, ALD and/or electro plating or other suitable methods.

In the foregoing manufacturing operations, the glue layer 54 and thebody metal layer 60 correspond to the glue layer 174 and the body layer176 of FIGS. 1A-1D, respectively. The silicide layer 52 corresponds tothe alloy layer 172 of FIGS. 1A-1D. The epitaxial layer 50 correspondsto the epitaxial layer 160 of FIGS. 1A-1D. The first and secondsemiconductor layer 22 and 24 correspond to the first semiconductorlayers 123 and second semiconductor layer 124 of FIGS. 1A and 1B,respectively. The fin structures (lower portion) 20 correspond to thefin structures 120 of FIGS. 1A-1D. The isolation insulating layer 30corresponds to the isolation insulating layer 130 of FIGS. 1A-1D.

It is understood that the semiconductor test structures undergoesfurther CMOS processes to form various features, such as passivationlayers, etc.

The various embodiments or examples described herein offer severaladvantages over the existing art. For example, in the presentdisclosure, since the upper portions of the fin structures are fullywrapped around the contact metal materials, a lower resistivity can beachieved.

It will be understood that not all advantages have been necessarilydiscussed herein, no particular advantage is required for allembodiments or examples, and other embodiments or examples may offerdifferent advantages.

In accordance with an aspect of the present disclosure, a semiconductortest device for measuring a contact resistance includes: first finstructures, upper portions of the first fin structures protruding froman isolation insulating layer; epitaxial layers formed on the upperportions of the first fin structures, respectively; first conductivelayers formed on the epitaxial layers, respectively; a first contactlayer disposed on the first conductive layers at a first point; a secondcontact layer disposed on the first conductive layers at a second pointapart from the first point; a first pad coupled to the first contactlayer via a first wiring; and a second pad coupled to the second contactlayer via a second wiring. The semiconductor test device is configuredto measure the contact resistance between the first contact layer andthe first fin structures by applying a current between the first pad andthe second pad. In one or more of the foregoing and followingembodiments, the semiconductor test device further includes: second finstructures disposed adjacent to the first fin structures; a thirdcontact layer disposed on the first conductive layers of the second finstructure at a third point; and a third pad coupled to the third contactlayer via a third wiring. The upper portions of the second finstructures protrude from the isolation insulating layer, the epitaxiallayers are formed on the upper portions of the second fin structures,and the first conductive layers are formed on the epitaxial layers,respectively. The third pad is electrically connected to the first finstructure at the first point via a substrate. In one or more of theforegoing and following embodiments, the first conductive layers aresilicide layers. In one or more of the foregoing and followingembodiments, the first conductive layers fully wrap around the epitaxiallayers, respectively. In one or more of the foregoing and followingembodiments, the first and second contact layers are in contact with theisolation insulating layer. In one or more of the foregoing andfollowing embodiments, each of the first conductive layers includes twoor more conductive material layers. In one or more of the foregoing andfollowing embodiments, a total number of the first fin structures is atleast 10. In one or more of the foregoing and following embodiments,upper portions of the first fin structures include multiple layers ofdifferent semiconductor materials.

In accordance with another aspect of the present disclosure, a method ofmeasuring a contact resistance using a semiconductor test device isprovided. The semiconductor test device includes: first fin structures,upper portions of the first fin structures protruding from an isolationinsulating layer; epitaxial layers formed on the upper portions of thefirst fin structures, respectively; first conductive layers formed onthe epitaxial layers, respectively; a first contact layer disposed onthe first conductive layers at a first point; a second contact layerdisposed on the first conductive layers at a second point apart from thefirst point; a first pad coupled to the first contact layer via a firstwiring; and a second pad coupled to the second contact layer via asecond wiring. In the method, a current is applied between the first padand the second pad so that the current flows through the first finstructures. A voltage between the first pad and bottoms of the first finstructures at the first point is measured. The contact resistancebetween the first contact layer and the first fin structures iscalculated. In one or more of the foregoing and following embodiments,the semiconductor test device further includes: second fin structuresdisposed adjacent to the first fin structures, upper portions of thesecond fin structures protruding from the isolation insulating layer, athird contact layer disposed on the first conductive layers of thesecond fin structure at a third point; and a third pad coupled to thethird contact layer via a third wiring. The epitaxial layers are formedon the upper portions of the second fin structures and the firstconductive layers are formed on the epitaxial layers, respectively. Thethird pad is electrically connected to the first fin structure at thefirst point via a substrate. No current flows between the first pad andthe third pad. The voltage is measured between the first pad and thethird pad. In one or more of the foregoing and following embodiments,the first conductive layers are silicide layers. In one or more of theforegoing and following embodiments, the first conductive layers fullycover a top and sides of the epitaxial layers, respectively. In one ormore of the foregoing and following embodiments, the first conductivelayers are in contact with the isolation insulating layer. In one ormore of the foregoing and following embodiments, a total number of thefirst fin structures is at least 10.

In accordance with another aspect of the present disclosure, in a methodof manufacturing a semiconductor test device, first fin structures andsecond fin structures disposed adjacent to the first fin structures areformed. Upper portions of the first and second fin structures protrudefrom an isolation insulating layer disposed over a substrate. Epitaxiallayers are formed to wrap the upper portions of the first and second finstructures. Silicide layers are formed over the epitaxial layers. Afirst contact layer contacting the silicide layer is formed over a firstpoint of the first fin structures. A second contact layer contacting thesilicide layer is formed over a second point of the first finstructures. A third contact layer contacting the silicide layer isformed at a third point of the second fin structures. A first padcoupled to the first contact layer via a first wiring, a second padcoupled to the second contact layer via a second wiring, and a third padcoupled to the third contact layer via a third wiring are formed. In oneor more of the foregoing and following embodiments, the silicide layersfully cover a top and side of the epitaxial layers, respectively. In oneor more of the foregoing and following embodiments, before the formingthe epitaxial layers, one or more dielectric layers are formed over thefirst and second fin structures, and in the one or more dielectriclayers, a first opening is formed over the first point to expose theupper portions of the first fin structures, a second opening is formedover the second point to expose the upper portions of the first finstructures, and a third opening is formed over the third point to exposethe upper portions of the second fin structures. The epitaxial layersare formed on the exposed upper portions of the first and second finstructures in the first to third openings. In one or more of theforegoing and following embodiments, a number of the first finstructures exposed in the first and second openings is at least 10, anda number of the second fin structures exposed in the third opening is atleast 10. In one or more of the foregoing and following embodiments, thefirst to third contact layers are in contact with the isolationinsulating layer without any portion of the one or more dielectriclayers interposed between the first to third contact layers and theisolation insulating layer. In one or more of the foregoing andfollowing embodiments, the upper portions of the first and second finstructures include multiple layers of different semiconductor materials.

The foregoing outlines features of several embodiments or examples sothat those skilled in the art may better understand the aspects of thepresent disclosure. Those skilled in the art should appreciate that theymay readily use the present disclosure as a basis for designing ormodifying other processes and structures for carrying out the samepurposes and/or achieving the same advantages of the embodiments orexamples introduced herein. Those skilled in the art should also realizethat such equivalent constructions do not depart from the spirit andscope of the present disclosure, and that they may make various changes,substitutions, and alterations herein without departing from the spiritand scope of the present disclosure.

1. A semiconductor test device for measuring a contact resistance,comprising: first fin structures, upper portions of the first finstructures protruding from an isolation insulating layer; epitaxiallayers formed on the upper portions of the first fin structures,respectively; first conductive layers formed on the epitaxial layers,respectively; a first contact layer disposed on the first conductivelayers at a first point; a second contact layer disposed on the firstconductive layers at a second point apart from the first point; a firstpad coupled to the first contact layer via a first wiring; and a secondpad coupled to the second contact layer via a second wiring, wherein thesemiconductor test device is configured to measure the contactresistance between the first contact layer and the first fin structuresby applying a current between the first pad and the second pad.
 2. Thesemiconductor test device of claim 1, further comprising: second finstructures disposed adjacent to the first fin structures, upper portionsof the second fin structures protruding from the isolation insulatinglayer, the epitaxial layers being formed on the upper portions of thesecond fin structures and the first conductive layers being formed onthe epitaxial layers, respectively; a third contact layer disposed onthe first conductive layers of the second fin structure at a thirdpoint; and a third pad coupled to the third contact layer via a thirdwiring, wherein: the third pad is electrically connected to the firstfin structure at the first point via a substrate.
 3. The semiconductortest device of claim 2, wherein the first conductive layers are silicidelayers.
 4. The semiconductor test device of claim 2, wherein the firstconductive layers fully cover a top and sides of the epitaxial layers,respectively.
 5. The semiconductor test device of claim 4, wherein thefirst and second contact layers are in contact with the isolationinsulating layer.
 6. The semiconductor test device of claim 5, whereineach of the first conductive layers includes two or more conductivematerial layers.
 7. The semiconductor test device of claim 2, wherein atotal number of the first fin structures is at least
 10. 8. Thesemiconductor test device of claim 2, wherein the upper portions of thefirst fin structures include multiple layers of different semiconductormaterials.
 9. A method of measuring a contact resistance using asemiconductor test device, the semiconductor test device including:first fin structures, upper portions of the first fin structuresprotruding from an isolation insulating layer; epitaxial layers formedon the upper portions of the first fin structures, respectively; firstconductive layers formed on the epitaxial layers, respectively; a firstcontact layer disposed on the first conductive layers at a first point;a second contact layer disposed on the first conductive layers at asecond point apart from the first point; a first pad coupled to thefirst contact layer via a first wiring; and a second pad coupled to thesecond contact layer via a second wiring, the method comprising:applying a current between the first pad and the second pad so that thecurrent flows through the first fin structures; measuring a voltagebetween the first pad and bottoms of the first fin structures at thefirst point; and calculating the contact resistance between the firstcontact layer and the first fin structures.
 10. The method of claim 9,wherein: the semiconductor test device further includes: second finstructures disposed adjacent to the first fin structures, upper portionsof the second fin structures protruding from the isolation insulatinglayer, the epitaxial layers being formed on the upper portions of thesecond fin structures and the first conductive layers being formed onthe epitaxial layers, respectively; a third contact layer disposed onthe first conductive layers of the second fin structure at a thirdpoint; and a third pad coupled to the third contact layer via a thirdwiring, the third pad is electrically connected to the first finstructure at the first point via a substrate, no current flows betweenthe first pad and the third pad, and the voltage is measured between thefirst pad and the third pad.
 11. The method of claim 10, wherein thefirst conductive layers are silicide layers.
 12. The method of claim 10,wherein the first conductive layers fully wrap around exposed portionsof epitaxial layers, respectively.
 13. The method of claim 12, whereinthe first conductive layers are in contact with the isolation insulatinglayer.
 14. The method of claim 10, wherein a total number of the firstfin structures is at least
 10. 15-20. (canceled)
 21. The semiconductortest device of claim 10, wherein the first conductive layers fully covera top and sides of the epitaxial layers, respectively.
 22. Thesemiconductor test device of claim 21, wherein the first and secondcontact layers are in contact with the isolation insulating layer. 23.The semiconductor test device of claim 22, wherein each of the firstconductive layers includes two or more conductive material layers. 24.The semiconductor test device of claim 10, wherein the upper portions ofthe first fin structures include multiple layers of differentsemiconductor materials.
 25. A semiconductor test device for measuring acontact resistance, comprising: first fin structures, upper portions ofthe first fin structures protruding from an isolation insulating layer;epitaxial layers formed on the upper portions of the first finstructures, respectively; first conductive layers formed on theepitaxial layers, respectively; a first contact layer disposed on thefirst conductive layers at a first point; a first pad coupled to thefirst contact layer via a first wiring; second fin structures disposedadjacent to the first fin structures, upper portions of the second finstructures protruding from the isolation insulating layer, the epitaxiallayers being formed on the upper portions of the second fin structuresand the first conductive layers being formed on the epitaxial layers,respectively; a second contact layer disposed on the first conductivelayers of the second fin structure at a second point; and a second padcoupled to the second contact layer via a second wiring, wherein thethird pad is electrically connected to the first fin structure at thefirst point via a substrate.
 26. The semiconductor test device of claim25, wherein the first conductive layers are silicide layers.